Birck XPS Workshop

I would like to announce that a new XPS workshop “Practical aspects of XPS: from sample preparation to spectra interpretations” has been scheduled on December 7-9, 2021at 9 am – 1 pm. Every research group using or planning to use Surface Analysis characterization tools should have at least one trained student.

Course Description: XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard technique for the characterization of solid surfaces. The course will teach how and what information can be provided by XPS. The quantification of the XPS data will be discussed in detail (thickness calculation, coverage, atomic percentage, etc.)

Registration is at https://forms.gle/B7xjCHWADG9yVmTk6.

Cost is $250.

Instructor: Dmitry Zemlyanov (dzemlian@purdue.edu)